io-port 70056338 Nagura, Yoshihiro;
Mullins, Michael;
Sauvageau, Anthony;
Fujiwara, Yoshinoro;
Furue, Katsuya;
Ohmura, Ryuji;
Komoike, Tatsunori;
Okitaka, Takenori;
Tanizaki, Tetsushi;
Dosaka, Katsumi;
Arimoto, Kazutami;
Koda, Yukiyoshi;
Tada, Tetsuo
Test cost reduction by at-speed BISR for embedded drams (English)
ITC, 182-187 (2001).
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