05101959

j

05101959 Maurer, Peter M. Generating Test Data with Enhanced Context-Free Grammars. IEEE Software 07, No.04, 50-55 (1990). 1990 IEEE Computer Society EN test data generation context-free grammars functional testing very-large-scale integrated circuits systematic tests testing subroutines VLSI circuit simulators debug integrated circuit testing VLSI

doi:10.1109/52.56422

Summary: The use of context-free grammars to improve functional testing of very-large-scale integrated circuits is described. It is shown that enhanced context-free grammars are effective tools for generating test data. The discussion covers preliminary considerations, the first tests, generating systematic tests, and testing subroutines. The author's experience using context-free grammars to generate tests for VLSI circuit simulators indicates that they are remarkably effective tools that virtually anyone can use to debug virtually any program.