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<item>
  <id>05962925</id>
  <dt>a</dt>
  <an>05962925</an>
  <augroup>
    <au>Prabhu, Pravin</au>
    <au>Akel, Ameen</au>
    <au>Grupp, Laura M.</au>
    <au>Yu, Wing-Kei S.</au>
    <au>Suh, G.Edward</au>
    <au>Kan, Edwin</au>
    <au>Swanson, Steven</au>
  </augroup>
  <ti>Extracting device fingerprints from flash memory by exploiting physical variations.</ti>
  <so>McCune, Jonathan M. (ed.) et al., Trust and trustworthy computing. 4th international conference, TRUST 2011, Pittsburgh, PA, USA, June 22--24, 2011. Proceedings. Berlin: Springer (ISBN 978-3-642-21598-8/pbk). Lecture Notes in Computer Science 6740, 188-201 (2011).</so>
  <py>2011</py>
  <pu>Berlin: Springer</pu>
  <lagroup>
    <la>EN</la>
  </lagroup>
  <ccgroup>
  </ccgroup>
  <utgroup>
  </utgroup>
  <cigroup>
  </cigroup>
  <ligroup>
    <li>doi:10.1007/978-3-642-21599-5_14</li>
  </ligroup>
  <abgroup>
    <ab>Summary: We evaluate seven techniques for extracting unique signatures from NAND flash devices based on observable effects of process variation. Four of the techniques yield usable signatures that represent different trade-offs between speed, robustness, randomness, and wear imposed on the flash device. We describe how to use the signatures to prevent counterfeiting and uniquely identify and/or authenticate electronic devices.</ab>
    <rv></rv>
  </abgroup>
</item>