io-port 70036670 Sultan, Akif;
Faricelli, John;
Suryagandh, Sushant;
Vanmeer, Hans;
Mathur, Kaveri;
Pattison, James;
Hannon, Sean;
Constant, Greg;
Kumar, Kalyana;
Carrejo, Kevin;
Meier, Joe;
Topaloglu, Rasit Onur;
Chan, Darin;
Hahn, Uwe;
Knopp, Thorsten;
Andrade, Victor;
Gardiol, Bill;
Hejl, Steve;
Wu, David;
Buller, James;
Bair, Larry;
Icel, Ali;
Apanovich, Yuri
CAD utilities to comprehend layout-dependent stress effects in 45 nm high- performance SOI custom macro design (English)
ISQED, 442-446 (2009).
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