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<item>
  <id>06004139</id>
  <dt>j</dt>
  <an>06004139</an>
  <augroup>
    <au>Seker\'ak, Martin</au>
    <au>Michaeli, Linus</au>
    <au>\v{S}aliga, J\'an</au>
    <au>Godla, Marek</au>
  </augroup>
  <ti>Dynamic dac testing by registration of the input code wordin equality when the dac output matches a reference signal.</ti>
  <so>Acta Electrotech. Inform. 11, No. 3, 31-35 (2011).</so>
  <py>2011</py>
  <pu>Faculty of Electrical Engineering and Informatics, Technical University of Ko\v sice, Ko\v sice; Versita, Warsaw</pu>
  <lagroup>
    <la>EN</la>
  </lagroup>
  <ccgroup>
  </ccgroup>
  <utgroup>
    <ut>digital to analog converter (DAC)</ut>
    <ut>dithering</ut>
    <ut>DNL</ut>
    <ut>INL</ut>
    <ut>comparator</ut>
  </utgroup>
  <cigroup>
  </cigroup>
  <ligroup>
    <li>doi:10.2478/v10198-011-0027-6</li>
  </ligroup>
  <abgroup>
    <ab>Summary: The characterization of high resolution Digital to Analog Converter (DAC) involves new problems caused by their high performance. This paper presents a new method for measuring the characteristics of high resolution DACs under dynamic condition. The main principle of the proposed method is the conversion of the DAC analog output voltage to a digital code. The one that is corresponding to the equality of the DAC output voltage and reference signal by using a fast comparator, a dithering DAC and an accurate dc voltmeter. The output of the comparator is used as the control signal to register the digital input code word of the DAC in a fast memory. After digital processing the registered record of digital code words is used to determine the Integral-nonlinearity (INL) and Differential-nonlinearity (DNL) of the DAC under test.</ab>
    <rv></rv>
  </abgroup>
</item>