id: 05745291
dt: j
an: 05745291
au: Hsieh, Wen-Wen; Chen, S.-L.; Lin, I-Sheng; Hwang, Tingting
ti: A physical-location-aware X-filling method for IR-drop reduction in
    at-speed scan test.
so: IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. 29, No. 2, 289-298
    (2010).
py: 2010
pu: IEEE, New York, NY
la: EN
cc: 
ut: 
ci: 
li: doi:10.1109/TCAD.2009.2035584