id: 05101959
dt: j
an: 05101959
au: Maurer, Peter M.
ti: Generating Test Data with Enhanced Context-Free Grammars.
so: IEEE Software 07, No.04, 50-55 (1990).
py: 1990
pu: IEEE Computer Society
la: EN
cc: 
ut: test data generation; context-free grammars; functional testing;
    very-large-scale integrated circuits; systematic tests; testing
    subroutines; VLSI circuit simulators; debug; integrated circuit
    testing; VLSI
ci: 
li: doi:10.1109/52.56422
ab: Summary: The use of context-free grammars to improve functional testing of
    very-large-scale integrated circuits is described. It is shown that
    enhanced context-free grammars are effective tools for generating test
    data. The discussion covers preliminary considerations, the first
    tests, generating systematic tests, and testing subroutines. The
    author’s experience using context-free grammars to generate tests for
    VLSI circuit simulators indicates that they are remarkably effective
    tools that virtually anyone can use to debug virtually any program.
rv: