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\iteman{io-port 05101959}
\itemau{Maurer, Peter M.}
\itemti{Generating Test Data with Enhanced Context-Free Grammars.}
\itemso{IEEE Software 07, No.04, 50-55 (1990).}
\itemab
Summary: The use of context-free grammars to improve functional testing of very-large-scale integrated circuits is described. It is shown that enhanced context-free grammars are effective tools for generating test data. The discussion covers preliminary considerations, the first tests, generating systematic tests, and testing subroutines. The author's experience using context-free grammars to generate tests for VLSI circuit simulators indicates that they are remarkably effective tools that virtually anyone can use to debug virtually any program.
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\itemcc{}
\itemut{test data generation; context-free grammars; functional testing; very-large-scale integrated circuits; systematic tests; testing subroutines; VLSI circuit simulators; debug; integrated circuit testing; VLSI}
\itemli{doi:10.1109/52.56422}
\end