id: 05891371
dt: j
an: 05891371
au: Yilmaz, Mahmut; Chakrabarty, Krishnendu; Tehranipoor, Mohammad
ti: Test-pattern selection for screening small-delay defects in very-deep
    submicrometer integrated circuits.
so: IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. 29, No. 5, 760-773
    (2010).
py: 2010
pu: IEEE, New York, NY
la: EN
cc: 
ut: 
ci: 
li: doi:10.1109/TCAD.2010.2043591