05441620

j

05441620 Wen, Xiaoqing Tamamoto, Hideo Kinoshita, Kozo $I_{DDQ}$ test vector selection for transistor short fault testing. Syst. Comput. Jpn. 28, No. 5, 11-21 (1997). 1997 John Wiley \& Sons, Bognor Regis, West Sussex EN

doi:10.1002/(SICI)1520-684X(199705)28:5<11::AID-SCJ2>3.0.CO;2-R