id: 05441620
dt: j
an: 05441620
au: Wen, Xiaoqing; Tamamoto, Hideo; Kinoshita, Kozo
ti: $I_{DDQ}$ test vector selection for transistor short fault testing.
so: Syst. Comput. Jpn. 28, No. 5, 11-21 (1997).
py: 1997
pu: John Wiley \& Sons, Bognor Regis, West Sussex
la: EN
cc: 
ut: 
ci: 
li: doi:10.1002/(SICI)1520-684X(199705)28:5<11::AID-SCJ2>3.0.CO;2-R