id: 70542591
dt: a
an: 70542591
au: Shinogi, Tsuyoshi; Hayashi, Terumine
ti: A simple and efficient method for generating compact IDDQ test set for
    bridging fault
so: VTS, 112-117 (1998).
py: 1998
pu: 
la: EN
cc: 
ut: 
ci: 
li: http://csdl2.computer.org/dl/proceedings/vts/1998/8436/00/84360112.pdf