id: 01745006
dt: a
an: 01745006
au: Elad, Michael; Hel-Or, Yacov; Keshet, Renato
ti: Pattern detection using a maximal rejection classifier.
so: Arcelli, Carlo (ed.) et al., Visual form 2001. 4th international workshop,
    IWVF4, Capri, Italy, May 28-30, 2001. Proceedings. Berlin: Springer.
    Lect. Notes Comput. Sci. 2059, 514-524 (2001).
py: 2001
pu: Berlin: Springer
la: EN
cc: 
ut: 
ci: 
li: http://link.springer.de/link/service/series/0558/bibs/2059/20590514
ab: Summary: In this paper we propose a new classifier - the Maximal Rejection
    Classifier (MRC) - for target detection. Unlike pattern recognition,
    pattern detection problems require a separation between two classes,
    {\it Target} and {\it Clutter}, where the probability of the former is
    substantially smaller, compared to that of the latter. The MRC is a
    linear classifier, based on successive rejection operations. Each
    rejection is performed using a projection followed by thresholding. The
    projection vector is designed to maximize the number of rejected {\it
    Clutter} inputs. It is shown that it also minimizes the expected number
    of operations until detection. An application of detecting frontal
    faces in images is demonstrated using the MRC with encouraging results.
rv: