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io-port 50233571
Bourgeat, J.
;
Galy, Philippe
;
Dray, A.
;
Jimenez, J.
;
Marin-Cudraz, D.
;
Jacquier, B.
A full characterization of single pitch IO ESD protection based on silicon controlled rectifier and dynamic trigger circuit in CMOS 32 nm node
(English)
Microelectronics Reliability 51, No. 9-11, 1614-1617 (2011).
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