id: 71001871
dt: a
an: 71001871
au: Vollgraf, Roland; Scholz, Michael; Meinertzhagen, Ian A.; Obermayer, Klaus
ti: Nonlinear filtering of electron micrographs by means of support vector
    regression
so: NIPS (2003).
py: 2003
pu: 
la: EN
cc: 
ut: 
ci: 
li: http://books.nips.cc/papers/files/nips16/NIPS2003_BI04.pdf