50265372

j

50265372 Mao, V. Thusu, V. Dwyer, Chris Chakrabarty, Krishnendu Connecting fabrication defects to fault models and SPICE simulations for DNA self-assembled nanoelectronics IET Computers & Digital Techniques 3, No. 6, 553-569 (2009). 2009 EN

doi:10.1049/iet-cdt.2008.0136