id: 50354748
dt: j
an: 50354748
au: Nadeau-Dostie, Benoit; Burek, Dwayne; Hassan, Abu S. M.
ti: Scanbist: A multifrequency scan-based BIST method
so: IEEE Design & Test of Computers 11, No. 1, 7-17 (1994).
py: 1994
pu: 
la: EN
cc: 
ut: 
ci: 
li: http://doi.ieeecomputersociety.org/10.1109/54.262318