@article {IOPORT.50233204,
    author       = {Kim, Jin-Young and Yu, Chong-Gun and Park, Jong-Tae},
    title        = {Effects of device layout on the drain breakdown voltages in mugfets},
    year         = {2011},
    journal      = {Microelectronics Reliability},
    volume       = {51},
    number       = {9-11},
    pages        = {1547-1550},
    doi          = {10.1016/j.microrel.2011.07.010},
    identifier   = {50233204},
}