id: 50234745
dt: j
an: 50234745
au: Ispasoiu, Radu; Crawford, Tom; Johnston, Brian; Shaw, Chris; Kasapi,
    Steven; Goertz, Jason; Rinaudo, Olivier; Ouimet, Peter
ti: Reduction of the acquisition time for CMOS time-resolved photon emission by
    optimized IR detection
so: Microelectronics Reliability 46, No. 9-11, 1504-1507 (2006).
py: 2006
pu: 
la: EN
cc: 
ut: 
ci: 
li: doi:10.1016/j.microrel.2006.07.026