05459902

j

05459902 Sabade, Sagar S. Walker, D.M.H. Estimation of fault-free leakage current using wafer-level spatial information. IEEE Trans. VLSI Syst. 14, No. 1, 91-94 (2006). 2006 IEEE, Piscataway, NJ EN

doi:10.1109/TVLSI.2005.863183